ACK: [PATCH 3/3] fwts-test: Update tests to accommodate new ECDT test
ivanhu
ivan.hu at canonical.com
Mon Jun 15 08:13:25 UTC 2015
On 2015年06月13日 01:40, Colin King wrote:
> From: Colin Ian King <colin.king at canonical.com>
>
> Update for ECDT test
>
> Signed-off-by: Colin Ian King <colin.king at canonical.com>
> ---
> fwts-test/arg-show-tests-0001/arg-show-tests-0001.log | 2 ++
> fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log | 6 +++++-
> 2 files changed, 7 insertions(+), 1 deletion(-)
>
> diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> index 8b37704..e78e9be 100644
> --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> +++ b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> @@ -6,6 +6,7 @@ ACPI tests:
> checksum ACPI table checksum test.
> cstates Processor C state support test.
> dmar DMA Remapping (VT-d) test.
> + ecdt Embedded Controller Boot Resources Table test.
> fadt FADT SCI_EN enabled tests.
> hpet_check HPET configuration tests.
> mcfg MCFG PCI Express* memory mapped config space test.
> @@ -33,6 +34,7 @@ Batch tests:
> dmar DMA Remapping (VT-d) test.
> dmicheck DMI/SMBIOS table tests.
> ebda Test EBDA region is mapped and reserved in memory map table.
> + ecdt Embedded Controller Boot Resources Table test.
> fadt FADT SCI_EN enabled tests.
> fan Simple fan tests.
> hda_audio HDA Audio Pin Configuration test.
> diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index d297e33..8e512bc 100644
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -16,6 +16,8 @@ ACPI tests:
> Test all CPUs C-states.
> dmar (1 test):
> DMA Remapping test.
> + ecdt (1 test):
> + ECDT Embedded Controller Boot Resources Table test.
> fadt (2 tests):
> Test FADT SCI_EN bit is enabled.
> Test FADT reset register.
> @@ -264,6 +266,8 @@ Batch tests:
> Test DMI/SMBIOS tables for errors.
> ebda (1 test):
> Test EBDA is reserved in E820 table.
> + ecdt (1 test):
> + ECDT Embedded Controller Boot Resources Table test.
> fadt (2 tests):
> Test FADT SCI_EN bit is enabled.
> Test FADT reset register.
> @@ -718,4 +722,4 @@ UEFI tests:
> Test UEFI RT service query variable info interface stress test.
> Test UEFI RT service get variable interface, invalid parameters.
>
> -Total of 613 tests
> +Total of 615 tests
Acked-by: Ivan Hu<ivan.hu at canonical.com>
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